The X-ray characterization capabilities at MCLinc include XRD.
X-ray diffraction (XRD) takes advantage of the coherent scattering of x-rays by polycrystalline materials to obtain a wide range of quantitative and qualitative structural information. The x-rays are scattered by each set of lattice planes at a characteristic angle, and the scattered intensity is a function of the atoms which occupy those planes. Distortions in the lattice planes due to stress, solid solution, or other effects can be measured.